ChipPAC Qualification Results

Assembly Site:  ChipPAC, Shanghai (CPS)

Package Style:  PDIP

Product

Technology

Die Dimensions (mil)

Lead Count

Duration HIP2106IP

PASIC 2

62 X 88

8 lead

ICM7555IPA

MGFF

48 x 48

8 lead

CDP68HC68T1E

CMOS

126 x 92

16 lead

HC3-5504B-5

HVTDLM

129 x 100

24 lead

HI5721BIP

HBC10

187 x 153

28 lead

CDP68HC05-C16

CMOS4

153 x 181

40 lead

 

CDP1802

CCL

161 x 211

40 lead

HTOL

Ta = 125C

500 hr

1000 hr

No Boards

Available

0 / 78

0 / 78

0 / 78

0 / 78

-

0 / 74 (a)

0 / 78

0 / 78

0 / 78

0 / 78

0 / 78

0 / 78

Temp/Humidity/Bias

85C/85%RH

500 hr

1000 hr

-

0 / 78

0 / 78

0 / 78

0 / 78

0 / 78

0 / 78

0 / 74 (b)

0 / 78

0 / 78

0 / 77 (C)

0 / 77

0 / 78

0 / 78

Pressure Cooker

121C / 100% RH

96 hr

192 hr

0 / 78

-

0 / 78

0 / 78

0 / 78

0 / 78

0 / 78

0 / 78

0 / 78

0 / 78

0 / 78 0 / 78

0 / 78

Temperature Cycle 

-65C to +150C

500 cyc

1000 cyc

-

0 / 78

0 / 78

0 / 78

0 / 78

0 / 78

0 / 78

0 / 78

0 / 78

0 / 78

0 / 78

0 / 78

0 / 78

0 / 78

Temperature Cycle

-40C to +125C

500 cyc

1000 cyc

-

0 / 78

0 / 78

0 / 78

0 / 78

0 / 78

0 / 78

0 / 78

Not

Performed

0 / 78

0 / 78

0 / 78

0 / 78

High Temp Storage

Ta = 150C

1000 hr 0 / 78 0 / 78 0 / 78 0 / 78 0 / 78 0 / 78 0 / 78
Post Temp Cycle
Wire Pull (grams)
1k cycles, -65C to +150C
5 devices, 100%
Average
Std. Dev.
Minimum
Maximum
12.8
1.9
9.0
16.9
7.9
0.7
6.1
9.2
12.1
2.1
7.5
15.8
10.8
2.4
0.8
16.1
10.2
1.9
5.8
15.5
12.9
1.4
9.1
17.1
10.9
1.8
6.7
14.3

Failure Analysis:

        a.  Four failures due to EOS.   Invalid failure. FA report # VI010103.

       b.   Four failures due to EOS.   Invalid failure.FA report # VI001109.

       c.  One failure due to fab related metal particle. Invalid failure.  FA report # IA000269